SDH test apparatus and SDH test method

专利名称：SDH test apparatus and SDH test method发明人：Matsumoto, Hisashi申请号：EP01100982.6申请日：20010117公开号：EP1119126B1公开日：20070926

摘要：A SDH test apparatus substitutes a part of payload of received SDH data with adesired data and transmits. A FIFO memory (23) is installed between the Rx AU processorand the Tx AU processor, stores sequentially AU data extracted by the Rx AU processorand outputs to the Tx AU processor in the order of memorization. An AU pointerprocessor (24) outputs an AU pointer adjusting the number of data in the FIFO memory,allowing the Tx AU processor to read in payload of AU data, after a time lag (ΔT2 + ΔT4)of information leading head position of payload generated by the processing of AU databy the Rx AU processor and the Tx AU processor, by extracting the number of data in theFIFO memory. The Tx AU processor is composed to read out the payload of AU datafrom the FIFO memory, generate AU data and output to the Tx SOH processor so thatthe information leading position is at the position designated by the AU pointer valueoutput from the AU pointer processor.

申请人：ANRITSU CORP

地址：JP

国籍：JP

代理机构：Sajda, Wolf E.

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