专利名称：HARDNESS TESTER AND HARDNESS
TESTING METHOD
发明人：Masaharu TSUJII,Satoko MORI,Takayuki
YAMADA
申请号：US15869384申请日：20180112
公开号：US20180217040A1公开日：20180802
专利附图：
摘要：A hardness tester includes a measurer (CPU) measuring a value for a materialcharacteristic of a sample in conjunction with formation of an indentation, an acquirer
(CPU) acquiring measurement data associated with the value for the materialcharacteristic of the sample measured by the measurer, and a determiner (CPU)accumulating a predetermined value for the material characteristic based on themeasurement data acquired by the acquirer and determining a time to replace theindenter based on the accumulated value for the material characteristic.
申请人：MITUTOYO CORPORATION
地址：Kanagawa JP
国籍：JP
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