Semiconductor integrated device

专利名称：Semiconductor integrated device发明人：Akihiro Ishihara申请号：US09/3595申请日：19990903公开号：US06145087A公开日：20001107

摘要：At the beginning of a test, a selector 22 selects and outputs a test clock CLKtprovided by an LSI tester in conformance to a select signal SL. In response, test data arestored in an input data register 24 in synchronization with the clock CLKt. If the logic levelof the select signal SL is changed after the test data are stored, the selector 22 selects aninternal clock CLK generated by an internal oscillation circuit 21 and a core logic unit 23generates output data through an operation performed in synchronization with the clockCLK. These output data are stored in an output data register 25. If the logic level of theselect signal SL is changed after the output data are stored, the stored output data areoutput in synchronization with the clock CLKt.

申请人：OKI ELECTRIC INDUSTRY CO., LTD.

代理机构：Jones Volentine, LLC

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