METHOD AND APPARATUS FOR TEST CONNECTIVITY, COMMUN

专利名称：METHOD AND APPARATUS FOR TEST

CONNECTIVITY, COMMUNICATION, ANDCONTROL

发明人：Lee D. Whetsel申请号：US147781申请日：20141119

公开号：US20150074479A1公开日：20150312

专利附图：

摘要：Functional circuits and cores of circuits are tested on integrated circuits usingscan paths. Using parallel scan distributor and collector circuits for these scan paths

improves test access of circuits and cores embedded within ICs and reduces the IC'spower consumption during scan testing. A controller for the distributor and collectorcircuits includes a test control register, a test control state machine and a multiplexer.These test circuits can be connected in a hierarchy or in parallel. A conventional testaccess port or TAP can be modified to work with the disclosed test circuits.

申请人：Texas Instruments Incorporated

地址：Dallas TX US

国籍：US

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