Method of measuring thickness of cell gap of refle

专利名称：Method of measuring thickness of cell gap

of reflective type liquid crystal display

发明人：Wing-Kit Choi申请号：US09834872申请日：20010412公开号：US065387B2公开日：20030325

专利附图：

摘要：A method of measuring the thickness of a cell gap of a reflective type liquidcrystal display. An optical system having a rotating table, an input polarizer, a beamsplitter, and a output polarizer is used. A reflective type liquid crystal device is disposed

on a rotating table. An incident light is reflected by the liquid crystal device. The

reflective type liquid crystal device is located between the input polarizer and the outputpolarizer. A beta angle &bgr; is defined as the angle between the input light polarizationand the front liquid crystal director. A first formula is used to express the relationshipbetween the reflectivity Rand &bgr;. The reflectivity is Rthen differentiated by &bgr; toobtain a second formula that express the relationship between &bgr;and the thickness ofthe cell gap. The rotating table is rotated to measure the maximum value &bgr;of theangle &bgr;. The thickness d can thus be obtained more precisely.

申请人：AU OPTRONICS CORP

代理机构：J.C. Patents

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