电子显微学报 J. Chin. Electr. Micros. Soc.
第36卷
In-situ aging TEM study of GeSb2Te4 Nano-films
SONG Jian-xiang, ZHU Hai-yin, LIU Xian-qiang ^
(Institute of Microstructure and Properties of Advanced Materials, Beijing University of Technolog^^, Beijing 100124, China)The local structure of phase change material GeSbTe metastable phase has been widely studied for a long time. The
configuration of Ge in metastable phase plays an important role in the phase transition process. In this paper, the atomic structure of GeSb2Te4 metastable phase in different aging temperatures were studied by advanced in-situ transmission electron microscopy. The results show,that almost all of the Ge atoms in the GeSbgTej metastable phase are located in the tetrahedral position after aging for 60 min at 250 ^ , which is named as the pseudo-spinel structure. In contrast, there is no tetrahedral Ge if the aging temperature is below 250°C. The crystalline phases are mainly presented as rocksalt structure and partially hexagonal structure.Keywords GeSb2Te4 ;aging temperature;transmission electron microscopy;radial distribution function
^
Corresponding author
Abstract
*获奖照片介绍*
坚韧的小草
李
雷
(武汉大学物理科学与技术学院电子显微镜中心,湖北武汉430072)
作品简介:氧化锌纳米结构的微观形貌;拍摄仪器:FEI SIRION 200即使在污浊的土地上,也要坚强的生长,不被环境改变,坚持着自我。
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